Industrial-Grade PCIe 4.0 SSD: Unlock Speed and Reliability for Data-Intensive Workload
The Industrial-Grade PCIe Gen4 x4 NVMe SSDs unleash the power of next-gen computing, particularly suitable for 5G and AIoT applications and an excellent option in the gaming, data center, edge devices, and enterprise fields.
With the PCIe 4.0 technology adoption, Industrial-Grade PCIe 4.0 SSD features higher speed, wider bandwidth, and larger capacity compared to the products that apply PCIe 3.0 and even wide temperature tolerance from -40 to 85℃ to handle challenging industrial settings.
Besides, for higher data protection in the mass data era, the Innodisk Industrial-Grade PCIe 4.0 SSDs support the self-developed iCell technology to prevent data loss and device restarting issues during unexpected power failures.
Industrial-Grade PCIe 4.0 SSD Advantage
2x Speed
Twice as fast as the PCIe 3.0 products by employing PCIe 4.0 technology to reach double band width of 16GT/s and a maximum capacity of 4TB; It is downwards compatible with PCIe 3.0.
Efficient Cooling
Maximizes heat dissipation area with integrated graphene heat sink for efficient cooling that maintains reading and writing performance in levels.
Thermal Throttling
Uses data flow to reach smooth speed decrease control. As the temperature increases, it avoids sudden speed drop while the temperature is over the threshold
Ultra-data Transferring
Features an 8-channel controller and supports a hybrid mode SLC cache to reach a reading speed of up to 7,150 MB/s and a writing speed of up to 5,250 MB/s.
3D TLC NAND Flash
100% industrial-grade NAND with the newer process with 3D TLC 112 layers and higher capacity support to achieve 3,000 P/E cycles and a longer lifespan.
iCell Technology
Ensures reliable data protection by using capacitors with voltage detectors for instant and secure transfer of buffer data to flash storage. Its advanced data buffer management guarantees safe storage of all data in the flash chip before any power loss.
Industrial-Grade PCIe 4.0 SSDs Unlock Speed and Reliability for Data-Intensive Workloads
