AD-ACP-4340

4U Rackmount Chassis for Full-size SHB/SBC or ATX/MicroATX. 4 Hot Swap Drive Trays
Anewtech-Systems-Industrial-Computer-Chassis-AD-ACP-4340.-Advantech.
  • Supports a PICMG backplane with up to 14 slots or an ATX/Micro-ATX motherboard
  • Shock-resistant disk drive bay holds four hot-swap 3.5" and 2.5" SATA disk trays, one slim optical disk drive, and one 2.5" internal drive
  • Dual front USB 3.0 ports
  • Front-accessible system fan without opening top cover for easy maintenance
  • LED indicators and alarm notification for system fault detection
  • Smart fan speed control
  • Built-in Intrusion switch function
  • Built-in Intelligent System Module enabling whole system fan control and remote manageability
Datasheet
AD-ACP-4340.pdf
Product Specification
Anewtech-industrial-chassis-AD-ACP-4340-Advantech-industrial-computer-chassis

 

Case Study: Machine Automation Solutions: IC Wafer Prober and Tester

 

Background

Wafer testing is a crucial step performed during semiconductor device fabrication. It is performed by a piece of testing equipment called a wafer prober. The process of wafer testing can be referred to in several ways: Wafer Final Test (WFT), Electronic Die Sort (EDS) and Circuit Probe (CP) are common.

This project demanded advanced data acquisition devices to activate wafers and measure their electronic characteristics. Advantech's solution included a high sampling rate, individual analog input cards, and a convenient software development kit that satisfied technical requirements. This comprehensive solution effectively controlled costs and shortened development time for IC wafer testing machines.

Anewtech-Systems-factory-automation-Advantech--ACP-4340

System Requirements

The customer required precise, accurate measurements for electrical characteristics on the wafer prober. To achieve this goal, the amount of peripheral limited switches/devices need to be controlled in time to precise positions. The tester needed analog outputs with 16-bit resolution to activate wafers and individual 8-ch analog inputs with a simultaneous 250KS/s sampling rate to accurately measure the electrical characteristics of the wafers.

System Description

PCIE-1753 controls up to 96 peripheral limited switches/ devices in time, while the high-density DIO card satisfies pre cise position requirements. PCIE-1812 and PCIE-1824 meet wafer tester needs for analog output to activate and accurately measure electrical characteristics. PCIE-1824 offers high-density analog output channels which can activate up to 16-point to be measured on the wafer. After wafer activation, PCIE-1812 can simultaneously measure eight-point electrical characteristics of the wafer in a short time span.